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Deep Deformable Patch Metric Learning for Person Re-Identification.
Slawomir Bak
Peter Carr
Published in:
IEEE Trans. Circuits Syst. Video Technol. (2018)
Keyphrases
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metric learning
person re identification
distance metric
distance metric learning
semi supervised
learning tasks
image patches
multi task
pairwise
feature space
dimensionality reduction
distance function
image features
semi supervised learning
sparse representation