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A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits.
Sayandeep Sanyal
Mayukh Bhattacharya
Amit Patra
Pallab Dasgupta
Published in:
J. Electron. Test. (2020)
Keyphrases
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mixed signal
low power
vlsi circuits
multi channel
digital circuits
cmos technology
power consumption
high speed
low cost
single chip
digital signal processing
analog circuits
low voltage
pattern matching
hidden markov models
real time
image analysis
video sequences