Multivariable control of a metrological Atomic Force Microscope.
Michael J. C. RondeRoel J. E. MerryMarinus Jacobus Gerardus van de MolengraftRichard K. KoopsMaarten SteinbuchPublished in: ECC (2009)
Keyphrases
- control strategies
- control system
- robotic manipulator
- input output
- fuzzy logic controller
- control method
- impedance control
- force control
- genetic algorithm
- visual inspection
- robotic systems
- inverted pendulum
- control problems
- process control
- database
- closed loop
- image sequences
- decision trees
- artificial intelligence
- learning algorithm
- information retrieval
- data sets