BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing.

H. W. Wan Y. J. Hong Y. T. Cheng M. Hong

Published in: IRPS (2019)

Keyphrases

genetic algorithm
leakage current
simulated annealing
neural network
real world
reduction method
low voltage
nano scale
feature extraction
monte carlo
steady state
mathematical analysis
multiple input
database replication
metal oxide