A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros.

Akira Yamazaki Fukashi Morishita Naoya Watanabe Teruhiko Amano Masaru Haraguchi Hideyuki Noda Atsushi Hachisuka Katsumi Dosaka Kazutami Arimoto Setsuo Wake Hideyuki Ozaki Tsutomu Yoshihara

Published in: IEICE Trans. Electron. (2005)

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