Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography.

George C. Giakos R. Guntupalli N. Shah Srinivasan Vedantham Sankararaman Suryanarayanan Samir Chowdhury Richard Nemer A. G. Passerini K. Mehta S. Sumrain N. Patnekar K. Nataraj Edward A. Evans Robert J. Endorf F. Russo

Published in: IEEE Trans. Instrum. Meas. (2001)

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