R. Guntupalli

Publication Activity (10 Years)

Years Active: 1999-2005
Publications (10 Years): 0

Publications

George C. Giakos, N. Shah, Samir Chowdhury, Sankararaman Suryanarayanan, S. Sumrain, R. Guntupalli, A. Medithe, Srinivasan Vedantham, V. Kumar, Robert J. Endorf
An efficient, novel microstrip collector architecture for digital radiographic imaging CZT semiconductor sensors. IEEE Trans. Instrum. Meas. 54 (3) (2005)
George C. Giakos, Sankararaman Suryanarayanan, R. Guntupalli, J. Odogba, N. Shah, Srinivasan Vedantham, Samir Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, Robert J. Endorf
Detective quantum efficiency [DQE(0)] of CZT semiconductor detectors for digital radiography. IEEE Trans. Instrum. Meas. 53 (6) (2004)
George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar
Te semiconductors for digital radiographic imaging. IEEE Trans. Instrum. Meas. 52 (5) (2003)
George C. Giakos, R. Guntupalli, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, Richard Nemer, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, Edward A. Evans, Robert J. Endorf, F. Russo
Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography. IEEE Trans. Instrum. Meas. 50 (6) (2001)
George C. Giakos, R. Guntupalli, Richard Nemer, J. Odogba, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, Edward A. Evans, F. Russo
Optimization of the temporal response of II-VI direct type semiconductor detectors for flat-panel pulsed X-ray imaging. IEEE Trans. Instrum. Meas. 50 (6) (2001)
George C. Giakos, Srinivasan Vedantham, Samir Chowdhury, J. Odogba, Amlan Dasgupta, R. Guntupalli, Sankararaman Suryanarayanan, Victor A. Vega-Lozada, M. Sridhar, M. Khyati, N. Shah
Te detector-based X-ray imaging system. IEEE Trans. Instrum. Meas. 48 (5) (1999)