Using Atomic Force Microscopy for Deep-Submicron Failure Analysis.

Jien-Chung Lo William D. Armitage Corbet S. Johnson

Published in: IEEE Des. Test Comput. (2001)

Keyphrases

genetic algorithm
evolutionary algorithm
artificial neural networks
data analysis
learning environment
atomic force microscopy
quantitative analysis
power consumption
trade off
computational complexity
database
wide range
decision trees
decision making
search engine
neural network
data sets
real time