L1-regularized reconstruction for traction force microscopy.
Alejandro Sune-AunonAlvaro Jorge-PenasHans Van OosterwyckArrate Muñoz-BarrutiaPublished in: ISBI (2016)
Keyphrases
- least squares
- high resolution
- image analysis
- three dimensional
- high throughput
- image reconstruction
- neural network
- compressed sensing
- pattern recognition
- vision system
- compressive sensing
- discrete tomography
- semi supervised
- image enhancement
- reconstructed image
- reconstruction error
- shape recovery
- reconstruction process
- electron microscopy
- sparse reconstruction