Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs.
Isabella RossettoMatteo MeneghiniDavide BisiAlessandro BarbatoMarleen Van HoveDenis MarconTian-Li WuStefaan DecoutereGaudenzio MeneghessoEnrico ZanoniPublished in: Microelectron. Reliab. (2015)