Reducing Test Time Using an Enhanced RF Loopback.

Marcelo Negreiros Luigi Carro Altamiro Amadeu Susin

Published in: J. Electron. Test. (2007)

Keyphrases

test data
evolutionary algorithm
databases
multiscale
artificial neural networks
multiresolution
test cases
real time
data sets
data mining
training data
objective function
preprocessing
pairwise
significantly reduced