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Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors.
Manuel Domínguez Pumar
Chenna Reddy Bheesayagari
Sergi Gorreta
Gema Lopez-Rodriguez
Joan Pons-Nin
Published in:
IEEE Trans. Ind. Electron. (2018)
Keyphrases
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closed loop
ionizing radiation
open loop
control system
control scheme
control law
feedback control
parameter identification
low dose
asymptotic stability
positron emission tomography
induction motor
control loop
flight test
pid controller
x ray
multiscale
tracking error