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A Fast and Accurate approach for Full Chip Leakage Analysis of Nano-scale circuits considering Intra-die Correlations.
Sarvesh Bhardwaj
Sarma B. K. Vrudhula
Published in:
VLSI Design (2007)
Keyphrases
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data analysis
nano scale
high speed
low cost
information systems
case study
image analysis
database
machine learning
artificial intelligence
high accuracy
quantitative analysis
error analysis