Defect detection method for stamped patterns utilizing random access parallel matching technique.
Yoshihiro ShimaSeiji KashiokaToshikazu YasuePublished in: Systems and Computers in Japan (1987)
Keyphrases
- detection method
- random access
- processing elements
- face detection
- detection algorithm
- multiview video coding
- feature detection
- disk storage
- solid state
- memory size
- feature points
- parallel implementation
- parallel processing
- massively parallel
- multi dimensional
- digital images
- region detection
- three dimensional
- computer vision