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Identification of Defective TSVs in Pre-Bond Testing of 3D ICs.

Brandon NoiaKrishnendu Chakrabarty
Published in: Asian Test Symposium (2011)
Keyphrases
  • database
  • optimal solution
  • expert systems
  • test cases
  • automatic identification
  • mass spectrometry
  • data sets
  • real world
  • decision trees
  • database systems
  • evolutionary algorithm
  • test set
  • integrity constraints