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Unclamped repetitive stress on 1200 V normally-off SiC JFETs.

Carmine AbbateGiovanni BusattoFrancesco Iannuzzo
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • repetitive patterns
  • feature selection
  • image data
  • databases
  • artificial intelligence
  • decision trees
  • stress distribution