Pattern-Avoiding Ascent Sequences of Length 3.
Andrew R. ConwayMiles ConwayAndrew Elvey PriceAnthony J. GuttmannPublished in: Electron. J. Comb. (2022)
Keyphrases
- fixed length
- pattern matching
- finite alphabet
- arbitrary length
- sequence patterns
- sequential patterns
- complex patterns
- hidden markov models
- multi dimensional
- variable length
- real time
- pattern detection
- approximate pattern matching
- long sequences
- test sequences
- website
- feature vectors
- association rules
- image sequences
- sequence matching
- knowledge base
- total length
- information systems
- computer vision
- data mining
- neural network