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Combined nanorobotic AFM/SEM system as novel toolbox for automated hybrid analysis and manipulation of nanoscale objects.
Uwe Mick
Volkmar Eichhorn
Tim Wortmann
Claas Diederichs
Sergej Fatikow
Published in:
ICRA (2010)
Keyphrases
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semi automated
data mining
moving objects
fully automated
database
data sets
multiscale
video sequences
digital libraries
multiresolution
d objects
statistical analysis
object segmentation
software package
atomic force microscopy