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Trade-offs in scan path and BIST implementations for RAMs.

Michael NicolaidisO. KebichiVladimir Castro Alves
Published in: J. Electron. Test. (1994)
Keyphrases
  • scan path
  • trade off
  • eye movements
  • levenshtein distance
  • eye tracking data
  • eye tracking
  • usability testing
  • saliency map
  • visual analysis
  • search engine
  • image quality
  • high frequency
  • integrated circuit
  • built in self test