Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET.
Jaehyuk LimJinwoong LeeChanghwan ShinPublished in: IEEE Access (2021)
Keyphrases
- artificial neural networks
- neural network
- probabilistic model
- generative model
- edge detection
- back propagation
- edge information
- radial basis function
- backpropagation neural network
- intensity variations
- uncertain data
- edge detector
- line segments
- bayesian networks
- data sets
- feed forward
- weighted graph
- hough transform
- uniformly distributed
- evolutionary algorithm
- intensity profile
- considerable increase