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A Uniform Pressure Apparatus for Micro/Nanoimprint Lithography Equipment.
Jian-Shian Lin
Chieh-Lung Lai
Ya-Chun Tu
Cheng-Hua Wu
Yoshimi Takeuchi
Published in:
Int. J. Autom. Technol. (2009)
Keyphrases
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electron beam
virtual instrument
data mining
decision making
objective function
data structure
preprocessing
pairwise
electron beam lithography
electro mechanical systems