Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods.
Mohand BentobacheAhcène BounceurReinhardt EulerSalvador MirYann KiefferPublished in: VLSI-SoC (Selected Papers) (2013)
Keyphrases
- analog circuits
- machine learning algorithms
- machine learning methods
- linear models
- statistical models
- significant improvement
- computationally expensive
- pattern recognition
- machine learning
- numerical methods
- statistical tests
- statistical methods
- artificial intelligence
- mathematical models
- linear model
- classification models
- probabilistic model
- predictive model