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Two-Tone Signal Generation for ADC Testing.
Keisuke Kato
Fumitaka Abe
Kazuyuki Wakabayashi
Chuan Gao
Takafumi Yamada
Haruo Kobayashi
Osamu Kobayashi
Kiichi Niitsu
Published in:
IEICE Trans. Electron. (2013)
Keyphrases
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signal processing
high frequency
generation process
non stationary
frequency domain
original signal
sigma delta
data sets
test set
test cases
test data
wavelet packet
signal detection