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Simulation-Based Inspection Policies for a One-Shot System in Storage Over a Finite Time Span.
Won Young Yun
Young-Jin Han
Ha-Won Kim
Published in:
Commun. Stat. Simul. Comput. (2014)
Keyphrases
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data storage
storage and retrieval
finite number
efficient storage
management policies
processing capabilities
storage systems
unit length
data sets
neural network
state space
file system
structured light
defect detection
storage management
automatic inspection