Feature Selection Techniques for Improving Rare Class Classification in Semiconductor Manufacturing Process.
Jae Kwon KimKyu Cheol ChoJong Sik LeeYoungshin HanPublished in: BDTA (2016)
Keyphrases
- rare class
- manufacturing process
- rare classes
- quality control
- emerging patterns
- classification accuracy
- process control
- imbalanced datasets
- decision trees
- feature space
- manufacturing systems
- machine learning
- discrete event
- classification models
- control system
- feature selection
- supervised learning
- text classification
- class labels
- classification rules
- support vector machine
- active learning
- feature vectors
- support vector
- case study
- image processing
- learning algorithm
- real time