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Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces.

Jaeyoung SeoSooeun LeeMyungguk LeeChangjae MoonByungsub Kim
Published in: ISSCC (2022)
Keyphrases
  • duty cycle
  • low cost
  • general purpose
  • image restoration
  • fine grained
  • estimation error