On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing.
Abhishek SinghChintan PatelJim PlusquellicPublished in: ITC (2004)
Keyphrases
- mixed signal
- impulse response
- low power
- multi channel
- vlsi circuits
- digital circuits
- standard deviation
- cmos technology
- power consumption
- frequency domain
- high speed
- low cost
- regularization parameter
- var model
- low voltage
- fir filters
- single chip
- analog to digital converter
- data flow
- space variant
- real time
- signal processing
- high resolution
- multiresolution
- image sequences