Test sequencing algorithms with unreliable tests.
Vijay RaghavanMojdeh ShakeriKrishna R. PattipatiPublished in: IEEE Trans. Syst. Man Cybern. Part A (1999)
Keyphrases
- theoretical analysis
- post hoc
- computationally efficient
- machine learning algorithms
- data structure
- bayesian networks
- learning algorithm
- significant improvement
- computational cost
- database
- benchmark datasets
- test data
- computationally expensive
- computational complexity
- worst case
- image processing
- times faster
- statistical tests
- multiple choice
- databases