A don't care identification method for test compaction.
Hiroshi YamazakiMotohiro WakazonoToshinori HosokawaMasayoshi YoshimuraPublished in: DDECS (2013)
Keyphrases
- theoretical analysis
- similarity measure
- high accuracy
- computationally efficient
- synthetic data
- error rate
- long term
- detection method
- optimization algorithm
- input data
- high precision
- classification method
- detection algorithm
- mutual information
- computational cost
- dynamic programming
- significant improvement
- prior knowledge
- pairwise
- preprocessing
- information systems
- experimental evaluation
- experimental study
- test data
- optimal solution
- identification rate