Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method.
Jean Luc LefebvreChristian GautierFrédéric BarbierPublished in: Microelectron. Reliab. (2009)
Keyphrases
- detection method
- high accuracy
- high precision
- test data
- pairwise
- cost function
- preprocessing
- cross correlation
- significant improvement
- synthetic data
- segmentation method
- experimental evaluation
- dynamic programming
- prior knowledge
- computational complexity
- objective function
- data sets
- correlation analysis
- feature set
- edge detection
- computational cost
- similarity measure
- image processing