Optimisation of Gate-Drain/Source Overlap in 90 nm NMOSFETs for Low Noise Amplifier Performance.

R. Srinivasan Navakanta Bhat

Published in: J. Low Power Electron. (2008)

Keyphrases

high noise
high sensitivity
low signal to noise ratio
random noise
noise level
genetic algorithm
missing data
noise reduction
nm technology
noise sensitivity
image quality
signal to noise ratio
image noise
additive noise
metal oxide
noise free
arbitrary shape
high levels
noise removal
gaussian noise
low cost