Variability-Aware Noise-Induced Dynamic Instability of Ultra-Low-Voltage SRAM Bitcells.

Léopold Van Brandt Jean-Charles Delvenne Denis Flandre

Published in: CoRR (2024)

Keyphrases

low voltage
random access memory
power line
design considerations
missing data
leakage current
sensor networks
power consumption
real time
low cost
high speed
power management
computer vision
response time
data transmission
cmos technology