Reduced-code test method using sub-histograms for pipelined ADCs.
HyeonUk SonJaewon JangHeetae KimSungho KangPublished in: IEICE Electron. Express (2015)
Keyphrases
- high accuracy
- high precision
- synthetic data
- objective function
- cost function
- probabilistic model
- experimental evaluation
- optimization algorithm
- theoretical analysis
- support vector machine
- computational cost
- significant improvement
- computational complexity
- data flow
- test data
- pixel values
- genetic algorithm
- detection method
- support vector machine svm
- feature set
- prior knowledge
- preprocessing
- similarity measure