Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide.
Diego MilardovichMarkus JechDominic WaldhoerAl-Moatasem Bellah El-SayedTibor GrasserPublished in: ESSDERC (2021)
Keyphrases
- machine learning
- silicon dioxide
- prediction accuracy
- pattern recognition
- recursive neural networks
- prediction model
- data analysis
- decision trees
- prediction algorithm
- machine learning methods
- machine learning algorithms
- data sets
- computer vision
- semi supervised learning
- support vector machine
- artificial intelligence
- prediction error
- machine learning and statistical
- text classification
- information extraction
- inductive learning
- predictive model
- knowledge discovery
- experimentally determined
- learning algorithm
- feature selection