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Test program generation for mixed-signal integrated circuits based on automata network.

Sergey G. Mosin
Published in: EWDTS (2015)
Keyphrases
  • integrated circuit
  • mixed signal
  • built in self test
  • network structure
  • vlsi circuits
  • image processing
  • object oriented
  • low cost
  • test cases
  • multi channel
  • hardware description language