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Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification.

Doowon LeeTom KolanArkadiy MorgenshteinVitali SokhinRonny MoradAvi ZivValeria Bertacco
Published in: DAC (2016)
Keyphrases
  • generative model
  • data sets
  • neural network
  • probabilistic model
  • statistical analysis
  • bayesian networks
  • data analysis
  • image analysis
  • source code