Selective Algorithms for Built-In Self-Test and Self-Diagnosis in Embedded SRAMS.
Palanichamy ManikandanMohammad AreefBjørn B. LarsenVladimir HahanovPublished in: J. Low Power Electron. (2015)
Keyphrases
- learning algorithm
- recently developed
- theoretical analysis
- benchmark datasets
- computational efficiency
- computational complexity
- optimization problems
- orders of magnitude
- machine learning
- computationally efficient
- computer aided
- classification algorithm
- fault diagnosis
- machine learning algorithms
- data mining techniques
- computational cost
- significant improvement
- data structure
- clustering algorithm
- genetic algorithm