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Invited - A 2.2 GHz SRAM with high temperature variation immunity for deep learning application under 28nm.

Chun-Chen LiuYen-Hsiang WangYilei LiChien-Heng WongTien Pei ChouYoung-Kai ChenM.-C. Frank Chang
Published in: DAC (2016)
Keyphrases
  • deep learning
  • high temperature
  • power consumption
  • neural network
  • image segmentation
  • pattern recognition
  • text mining
  • decision support system
  • decision support
  • unsupervised learning