Wafer-scale High-Density Edge Coupling for High Throughput Testing of Silicon Photonics.
Robert PolsterLiang Yuan DaiOscar A. JimenezQixiang ChengMichal LipsonKeren BergmanPublished in: OFC (2018)
Keyphrases
- high density
- high throughput
- microarray
- low density
- genome wide
- biological data
- systems biology
- close proximity
- thin film
- genomic data
- data center
- edge detection
- low latency
- proteomic data
- data acquisition
- steady state
- mass spectrometry data
- protein protein interactions
- field effect transistors
- data mining
- machine learning