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An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification.
Uzma Batool
Mohd Ibrahim Shapiai
Salama A. Mostafa
Mohd Zamri Ibrahim
Published in:
IEEE Access (2023)
Keyphrases
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convolutional neural network
defect classification
face detection
neural network
decision making
search algorithm
semiconductor manufacturing
real time
digital libraries
special case
visual attention