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An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification.

Uzma BatoolMohd Ibrahim ShapiaiSalama A. MostafaMohd Zamri Ibrahim
Published in: IEEE Access (2023)
Keyphrases
  • convolutional neural network
  • defect classification
  • face detection
  • neural network
  • decision making
  • search algorithm
  • semiconductor manufacturing
  • real time
  • digital libraries
  • special case
  • visual attention