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Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution.

Zhengqi GaoJun TaoDian ZhouXuan Zeng
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • bayesian inference
  • statistical inference
  • data sets
  • text mining
  • hyperparameters
  • parametric models
  • semi parametric
  • hierarchical bayesian