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Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution.
Zhengqi Gao
Jun Tao
Dian Zhou
Xuan Zeng
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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bayesian inference
statistical inference
data sets
text mining
hyperparameters
parametric models
semi parametric
hierarchical bayesian