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Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories.

Petru CascavalStuart BennettCorneliu Hutanu
Published in: J. Electron. Test. (2004)
Keyphrases
  • random access
  • fault diagnosis
  • solid state
  • memory size
  • multiview video coding
  • test cases
  • disk storage