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A Statistical Test Generation Based on Mutation Analysis for Improving the Hardware Trojan Detection.
Yanjiang Liu
Yiqiang Zhao
Jiaji He
Ruishan Xin
Published in:
J. Circuits Syst. Comput. (2020)
Keyphrases
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statistical analysis
test generation
evolutionary algorithm
static analysis
low cost
test cases
machine learning
artificial intelligence
image processing
software engineering
open source
image quality