Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test.
Jin-Fu LiRuey-Shing TzengCheng-Wen WuPublished in: J. Electron. Test. (2002)
Keyphrases
- data compression
- compression algorithm
- built in self test
- data reduction
- compression ratio
- compression scheme
- mixed data
- high compression
- huffman coding
- lossless data compression
- image compression
- multiscale
- wavelet filters
- compressed data
- arithmetic coding
- lempel ziv
- low complexity
- computational complexity
- image processing
- wavelet compression
- high quality