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Transistor Hot Carrier Reliability Assurance in CMOS Technologies.
Daniel B. Jackson
David A. Bell
Brian S. Doyle
Bruce J. Fishbein
David B. Krakauer
Published in:
Digit. Tech. J. (1992)
Keyphrases
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high speed
low power
circuit design
power consumption
power dissipation
low cost
power supply
emerging technologies
metal oxide semiconductor
integrated circuit
highly reliable
reliability analysis
analog vlsi
data sets
human factors
failure rate
st century
website
delay insensitive