Closing the Defect Reduction Gap Between Software Inspection and Test-Driven Development: Applying Mutation Analysis to Iterative Test-First Programming.
Jerod W. WilkersonPublished in: AMCIS (2007)
Keyphrases
- development environment
- test driven development
- software development
- statistical analysis
- data analysis
- static analysis
- information technology
- image analysis
- data sets
- test cases
- software design
- information systems
- programming language
- computer systems
- software systems
- software testing
- defect detection
- neural network