Analog Circuit Specification Testing by Means of Walsh-Hadamard Transform and Multiple Regression Supported by Evolutionary Computations.
Tomasz GolonekJan MachniewskiPublished in: Circuits Syst. Signal Process. (2018)
Keyphrases
- multiple regression
- analog circuits
- statistical significance
- fault diagnosis
- partial least squares
- factor analysis
- walsh hadamard transform
- independent variables
- image processing
- genetic algorithm
- computer simulation
- sliding window
- maximum likelihood
- statistically significant
- fuzzy logic
- feature vectors
- pairwise
- digital circuits
- neural network
- data sets