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Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis.
Sunghoon Kim
Seokjun Jang
Sungho Kang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
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fault diagnosis
training data
expert systems
neural network
bp neural network
artificial intelligence
wavelet transform
fuzzy logic