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Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis.

Sunghoon KimSeokjun JangSungho Kang
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
  • fault diagnosis
  • training data
  • expert systems
  • neural network
  • bp neural network
  • artificial intelligence
  • wavelet transform
  • fuzzy logic