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Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution.
Narayanaswamy Balakrishnan
María Jaenada
Leandro Pardo
Published in:
J. Comput. Appl. Math. (2024)
Keyphrases
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power law
test statistic
real time
machine learning
null hypothesis
multi step
case study
data structure
spatial distribution
structured light
test data
post processing
statistical tests
energy consumption
low cost
preprocessing
decision trees
information systems
data mining