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High impact-induced failure of a novel solid MEMS switch.

Ying WangWenzhong LouYue ZhaoFufu Wang
Published in: NEMS (2013)
Keyphrases
  • high impact
  • high speed
  • three dimensional
  • failure rate
  • failure prediction
  • component failures
  • real world
  • data mining
  • genetic algorithm
  • artificial intelligence
  • case study
  • digital libraries
  • information technology